Semiconductor Material and Devices Characterization (Record no. 197596)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00531nam a22001817a 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20251127120733.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 211129b |||||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9971510618 |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 SCH-S |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Schroder, Dieter. K. |
| 245 ## - TITLE STATEMENT | |
| Title | Semiconductor Material and Devices Characterization |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | New York, |
| Name of publisher | John Wiley and Sons |
| Year of publication | 1990 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xv, 599 p. : ill. ; 25 cm. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Semiconductors |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Semiconductors--Testing |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books and Monographs |
| Full call number | Accession Number | Koha item type | Lost status | Damaged status | Permanent Location | Current Location | Shelving location | Date acquired |
|---|---|---|---|---|---|---|---|---|
| 621.38152 SCH-S | 7214 | Books and Monographs | Central Library, NIT Jalandhar | Central Library, NIT Jalandhar | General Stacks | 29.11.2021 |