IMPROVEMENT IN VALIDATION OF RELIABILITY RELATED FEATURES IN SEMICONDUCTOR CHIPS (Record no. 198590)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00704nam a22001817a 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20230905122617.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 230905b |||||||| |||| 00| 0 eng d |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621 |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | SOLANKI, DHRUVIN SHANKARBHAI |
| 245 ## - TITLE STATEMENT | |
| Title | IMPROVEMENT IN VALIDATION OF RELIABILITY RELATED FEATURES IN SEMICONDUCTOR CHIPS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Year of publication | 2023 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 51p |
| 502 ## - DISSERTATION NOTE | |
| Dissertation note | THIS THESIS BELONGS TO DEPARTMET OF ELECTRONICS AND COMMUNICATION ENGINEERING |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Relator term | ARUN KHOSLA & AKSHAY NALLUR |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Thesis & Dissertations |
| Damaged status | Collection code | Permanent Location | Current Location | Date acquired | Accession Number | Koha item type |
|---|---|---|---|---|---|---|
| Reference | Central Library, NIT Jalandhar | Central Library, NIT Jalandhar | 05.09.2023 | ETS/ECE/2023/184 | Thesis & Dissertations |