Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits (Record no. 45529)
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| 000 -LEADER | |
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| fixed length control field | 00787nam a2200229Ia 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20260619164052.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 210219s9999||||xx |||||||||||||| ||und|| |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 0792379918 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.395 BUS-E |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Bushnell,M.L |
| 245 #0 - TITLE STATEMENT | |
| Title | Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Boston |
| Name of publisher | Kluwer Academic |
| Year of publication | 2000 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xviii, 690 p. : ill. ; 26 cm. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Integrated circuits--Very large scale integration--Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Digital integrated circuits--Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Mixed signal circuits--Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Semiconductor storage devices--Testing |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Agrawal, Vishwani D |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books and Monographs |
| Full call number | Accession Number | Koha item type | Lost status | Damaged status | Permanent Location | Current Location | Shelving location | Date acquired |
|---|---|---|---|---|---|---|---|---|
| 621.395 BUS-E | 84482 | Books and Monographs | Central Library, NIT Jalandhar | Central Library, NIT Jalandhar | General Stacks | 20.02.2021 |