Analysis of impact ionization and GIDL writing methods in 100nm SOI DRAM. Joshi

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Material type: Text

TextPublication details: Jalandhar. Dr.B.R.Ambedkar National Institute of Te 2014Edition: Dr.B.R.AmbDescription: xi; 51pDDC classification:

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Holdings
Item type	Current library	Home library	Call number	Materials specified	Status	Date due	Barcode
Thesis & Dissertations	Central Library, NIT Jalandhar	Central Library, NIT Jalandhar			Available		TH000746