Flash memories: economic principles of performance, cost and reliability optimization
Material type:
TextSeries: Springer series in advanced microelectronics 40Publication details: New york Springer 2014ISBN: - 9789400760813
- 621.39732 RIC-F
| Item type | Current library | Home library | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
| Books and Monographs | Central Library, NIT Jalandhar General Stacks | Central Library, NIT Jalandhar | 621.39732 RIC-F (Browse shelf(Opens below)) | Available | 94683 |
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| 621.39732 LEE-D The design of CMOS radio frequency integrated circuits | 621.39732 LEE-D The design of CMOS radio frequency integrated circuits | 621.39732 RAD-C CMOS past, present and future | 621.39732 RIC-F Flash memories: economic principles of performance, cost and reliability optimization | 621.39732 SAK-L Low-voltage CMOS operational amplifiers : theory, design, and implementation | 621.39732 SHA-S Semiconductor memories: technology, testing and reliability | 621.39732 SHA-S Semiconductor memories: technology, testing and reliability |
The subject of this book is to introduce a model-based quantitative performance indicator methodology applicable for performance, cost and
reliability optimization of non-volatile memories. The complex example of flash memories is used to introduce and apply the methodology. It
has been developed by the author based on an industrial 2-bit to 4-bit per cell flash development project. For the first time, design and cost
aspects of 3D integration of flash memory are treated in this book. Cell, array, performance and reliability effects of flash memories are
introduced and analyzed. Key performance parameters are derived to handle the flash complexity. A performance and array memo...