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Surveying : Volume II

By: Contributor(s): Material type: TextTextLanguage: English Publication details: New Delhi; Laxmi Publications (P) Ltd., 2026.Edition: 17thDescription: xvii, 622pISBN:
  • 978-8170088837
  • 8170088836
Subject(s): DDC classification:
  • 624.1517 PUN-S
Summary: This Volume is continuation with Volume I, and deals with advanced topics of plane and Geodetic Surveying. The book contains sixteen chapters, including four chapters on Field Astronomy, Photogrammetric Surveying, Electro-Magnetic Distance Measurement (EDM) and Remote Sensing. Along with conventional instruments, the book also contains illustrations and descriptions of the most modern and advanced measuring instruments such as Wild T-2, T-3 and T-4 theodolites, Electronic theodolites, Distomats and Total Station. Each topic has been thoroughly described, the theory is rigorously developed and a large number of numerical examples have been included to illustrate its application. The book also contains advanced problems useful for competetive examinations.
Item type: Books and Monographs
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Item type Current library Home library Collection Call number Materials specified Status Date due Barcode
Books and Monographs Central Library, NIT Jalandhar General Stacks Central Library, NIT Jalandhar Civil Engineering 624.1517 PUN-S (Browse shelf(Opens below)) Available 103062

This Volume is continuation with Volume I, and deals with advanced topics of plane and Geodetic Surveying. The book contains sixteen chapters, including four chapters on Field Astronomy, Photogrammetric Surveying, Electro-Magnetic Distance Measurement (EDM) and Remote Sensing. Along with conventional instruments, the book also contains illustrations and descriptions of the most modern and advanced measuring instruments such as Wild T-2, T-3 and T-4 theodolites, Electronic theodolites, Distomats and Total Station. Each topic has been thoroughly described, the theory is rigorously developed and a large number of numerical examples have been included to illustrate its application. The book also contains advanced problems useful for competetive examinations.

Dr. Sanjeev, Librarian
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