| 000 | 00531nam a22001817a 4500 | ||
|---|---|---|---|
| 005 | 20251127120733.0 | ||
| 008 | 211129b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9971510618 | ||
| 041 | _aeng | ||
| 082 | _a621.38152 SCH-S | ||
| 100 |
_aSchroder, Dieter. K. _929691 |
||
| 245 | _aSemiconductor Material and Devices Characterization | ||
| 260 |
_aNew York, _bJohn Wiley and Sons _c1990 |
||
| 300 | _axv, 599 p. : ill. ; 25 cm. | ||
| 650 |
_aSemiconductors _962862 |
||
| 650 |
_a Semiconductors--Testing _962863 |
||
| 942 | _cBK | ||
| 999 |
_c197596 _d197596 |
||