| 000 | 00704nam a22001817a 4500 | ||
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| 005 | 20230905122617.0 | ||
| 008 | 230905b |||||||| |||| 00| 0 eng d | ||
| 041 | _aeng | ||
| 082 | _a621 | ||
| 100 |
_aSOLANKI, DHRUVIN SHANKARBHAI _931034 |
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| 245 | _aIMPROVEMENT IN VALIDATION OF RELIABILITY RELATED FEATURES IN SEMICONDUCTOR CHIPS | ||
| 260 |
_bDEPARTMENT OF ELECTRONICS AND COMMUNICATION ENGINEERING Dr. B. R. AMBEDKAR NATIONAL INSTITUTE OF TECHNOLOGY JALANDHAR, PUNJAB-144011 (INDIA) _c2023 |
||
| 300 | _a51p | ||
| 502 | _aTHIS THESIS BELONGS TO DEPARTMET OF ELECTRONICS AND COMMUNICATION ENGINEERING | ||
| 526 |
_aMTECH _b21204010 |
||
| 700 | _eARUN KHOSLA & AKSHAY NALLUR | ||
| 942 | _cTH | ||
| 999 |
_c198590 _d198590 |
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