000			00787nam a2200229Ia 4500
003			OSt
005			20260619164052.0
008			210219s9999||||xx |||||||||||||| ||und||
020			_a0792379918
082			_a621.395 BUS-E
100			_aBushnell,M.L _916546
245		0	_aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
260			_a Boston _bKluwer Academic _c2000
300			_axviii, 690 p. : ill. ; 26 cm.
650			_aIntegrated circuits--Very large scale integration--Testing _984870
650			_a Digital integrated circuits--Testing _984871
650			_a Mixed signal circuits--Testing _984872
650			_a Semiconductor storage devices--Testing _984873
700			_aAgrawal, Vishwani D _984874
942			_cBK
999			_c45529 _d45529