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Digital systems testing & testable design

Abramorici, Miron.

Digital systems testing & testable design - New York, IEEE Press. 1990 - xviii, 652 p. : ill. ; 27 cm.

ISBN: 0780310624

Subjects--Topical Terms:
Digital integrated circuits--Testing
Digital integrated circuits--Design and construction

Dewey Class. No.: 621.3815 ABR-D

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