Digital systems testing & testable design (Record no. 31894)

MARC details
000 -LEADER
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003 - CONTROL NUMBER IDENTIFIER
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005 - DATE AND TIME OF LATEST TRANSACTION
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008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
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020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 0780310624
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815 ABR-D
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Abramorici, Miron.
245 #0 - TITLE STATEMENT
Title Digital systems testing & testable design
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication New York,
Name of publisher IEEE Press.
Year of publication 1990
300 ## - PHYSICAL DESCRIPTION
Number of Pages xviii, 652 p. : ill. ; 27 cm.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Digital integrated circuits--Testing
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical Term Digital integrated circuits--Design and construction
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Breuer, Melvin .A.
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Friedman, Arthur D.
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books and Monographs
Holdings
Full call number Accession Number Koha item type Lost status Damaged status Permanent Location Current Location Shelving location Date acquired
621.3815 ABR-D 53341 Books and Monographs     Central Library, NIT Jalandhar Central Library, NIT Jalandhar General Stacks 22.10.2013
Dr. Sanjeev, Librarian
Managed by: Dr. D. P. Tripathi, Deputy Librarian, Central Library
For any query / question, please mail at circulation.liby@nitj.ac.in 

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